Session: K9-05: RADIATIVE COOLING AND RADIATIVE PROPERTIES OF NANOMATERIALS

Paper Number: 142054

142054 - Determination of Infrared Radiative Properties of Complex Media Using Partial Mueller-Matrix Ellipsometry 

Abstract: 

Tailoring optical and radiative properties has attracted a great deal of attention recently due to its importance in advanced energy systems, nanophotonics, electro-optics, and nanomanufacturing. Metamaterials with micro/nanostructures demonstrate exotic radiative properties with tunabilities over the spectrum, direction, and polarization. A full characterization of the optical and radiative properties of metamaterials is crucial for both fundamental research and the development of practical applications.

Mueller-matrix ellipsometry provides a nondestructive, noninvasive linear-optical spectroscopic technique to characterize the radiative properties of material by means of measuring the Mueller matrix using polarized light. Determining all elements of the 4 × 4 Mueller matrix requires the use of a polarization state generator and a polarization state analyzer with 16 (or more) measurements, which is also known as complete polarimetry. On the other hand, partial polarimetry uses a simpler generator and/or analyzer with a limitation to generate and/or analyze the states of polarizations; thus, it only measures a subset of the Mueller matrix directly. Partial polarimetry, however, may determine the full Mueller matrix under specific conditions when symmetric relations can be found between the elements of the Mueller matrix.

In this study, a theoretical approach and experimental practice are combined to examine the applicability of using partial polarimetry to determine full Mueller matrices. Symmetric relations of the Mueller matrices are derived and categorized into groups, allowing for the full determination by using a partial polarimeter with a simpler setup for each group. Calculations of the Mueller matrix across a wide range of scenarios, including anisotropic media, bianisotropic media, materials without Lorentz reciprocity, and diffractive gratings, are carried out to validate the theory. Furthermore, a partial polarimeter covering the wavelength range from 2 to 15 μm is set up and tested using grating samples. The experimental results are compared with the calculations obtained via rigorous-coupled-wave analysis (RCWA). This work provides valuable insights into Mueller matrix symmetry and offers experimental guidance for simplified ellipsometry measurements.

This work was supported by the National Science Foundation (CBET-2029892 for C.Y. and Z.M.Z.; DMR-2004749 for W.C.).

Presenting Author: chiyu yang Georgia Institute of Technology

Presenting Author Biography: Ph.D. Student @ Gatech

Authors:

chiyu yang Georgia Institute of Technology
Wenshan Cai Georgia Institute of Technology
Zhuomin Zhang Georgia Institute of Technology